Evidence of the Dominant Production Mechanism of Ammonia in a Hydrogen Plasma with Parts Per Million of Nitrogen
Plasma Study
Plasma-kg
conductedBy
- Ellis, James Person
- Köpp, Daniel Person
- Lang, Norbert Person
- van Helden, Jean-Pierre Person
hasMedium
- Hydrogen with Nitrogen admixtures Medium
- Krypton Medium
hasOutput
hasPlasmaSource
- AURA-WAVE (Sairem) Plasma Source
hasTopic
- Ammonia production mechanisms Research Topic
investigates
involves
- Krypton Medium
- NH3 Medium
- hydrogen atoms
- low pressure electron cyclotron resonance hydrogen plasma Plasma
usesConfiguration
- Configuration for AURA-WAVE: microwave frequency excitation 2.45 GHz; applied power range 100 – 150 W; chamber wall temperature varied in the range of 20° – 100°C; volume of the plasma reactor about 80 l
- Configuration for Medium: Hydrogen with dilution of nitrogen in the range of 0, 500, 1000, 1500, 2500 and 5000 ppm; Total flow rate of 14 sccm; Pressure varied in the range of 3 – 7 Pa
- Configuration for TALIF detection system: Nikon lens systems to image a region of interest of about 10 and 2 mm; spectral filter with a bandwidth of 10 nm centered at around 656 nm for hydrogen and 825 nm for krypton
- Configuration for TALIF laser system: Nd:YAG pump laser with a pulse width of 6 ns; 615 nm red light from dye laser is frequency doubled and remixed for sum-frequency generation to 205 nm radiation
usesDevice
- AURA-WAVE (Sairem) Plasma Source
- Andor iStar DH734x Diagnostic Device
- Nikon lens systems, Nikon Diagnostic Device
- Precision Scan SL dye laser, Sirah Diagnostic Device
- Quanta Ray Nd:YAG pump laser, Spectra Physics Diagnostic Device
usesMaterialEntity
- Krypton Medium
usesMethod
- Two-Photon Absorption Laser Induced Fluorescence (TALIF) Diagnostic Method
- calibration of fluorescence using krypton Diagnostic Method
- sum-frequency generation Method